Web1 dic 2008 · JEDEC JESD 22-A114 December 1, 2008 Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM) This test method establishes a standard …
JESD22-A114 Datasheet(PDF) - Richtek Technology Corporation
Web26 lug 2024 · Full Description. This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin … WebJESD22-A114F Published: Dec 2008 Status: Superseded> by ANSI/ESDA/JEDEC JS-001, April 2010. This test method establishes a standard procedure for testing and classifying … names for my black car
JC-14 JEDEC
WebJEDEC Specification EIA/JESD22-A114 1.3 Terms and Definitions: The terms used in this specification are defined as follows. 1.3.1 Component Failure: A condition in which a component does not meet all the requirements of the acceptance criteria, as specified in section 5, following the ESD test. 1.3.2 Device Under Test (DUT): Web30 giu 2024 · JEDEC工业标准修订版本.docx,1 / 5 JEDEC 工业标准 环境应力试验 [JDa1] JESD22-A100-B Cycled Temperature- Humidity-Bias Life Test 上电温湿度循环寿命试验, (Revision of JESD22-A100-A) April 2000 [Text-jd001] [JDa2] JESD22-A101-B Steady State Temperature Humidity Bias Life Test 上电温湿度稳态寿命试验, (Revision of WebESD Sensitivity(HBM) - Class 3A JESD22-A114-E Parameter Symbol Value Unit Forward Current I F 200 mA Power Dissipation P D 1.32 W Junction Temperature T j 125 ºC Operating Temperature T opr-40~ + 85 ºC Storage Temperature T stg-40 ~ + 100 ºC Table 3. Characteristics, I F =150mA, T j = 25ºC, RH30% Table 4. Absolute Maximum Ratings … meet the string family